Re: [dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

[Shally Verma <shallyv@marvell.com>]

Thanks Arek. Response inline.

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On 12-Jul-2019 6:45 PM, "Kusztal, ArkadiuszX" <arkadiuszx.kusztal@intel.com> wrote:
>
> In future we could unify tests even more (i.e. passing padding type as a param, or even information if it is encryption or signature generation) like Fan once done with blockcipher.

I will take a look at that but isn't test suite preferable otherwise? Means keeping it less interactive in nature? Else command line args will be different combinations of padding type, modulus length, crt/non-crt, op type ..is it okay to make it this way?

Thanks
Shally

>
> > -----Original Message-----
> > From: Ayuj Verma [mailto:ayverma@marvell.com]
> > Sent: Thursday, July 11, 2019 3:23 PM
> > To: akhil.goyal@nxp.com
> > Cc: Kusztal, ArkadiuszX <arkadiuszx.kusztal@intel.com>; Trahe, Fiona
> > <fiona.trahe@intel.com>; shallyv@marvell.com; ssahu@marvell.com;
> > kkotamarthy@marvell.com; anoobj@marvell.com; dev@dpdk.org; Ayuj
> > Verma <ayverma@marvell.com>
> > Subject: [PATCH v1 0/2] add tests for RSA key type CRT
> >
> > This patch series add new RSA CRT key based test cases, improve code
> > organization and also rebase it to latest changes.
> > It covers following changes:
> >
> > * Add crt key based rsa sign/verify, enc/decrypt test cases
> > * Move common code of enqueue/dequeue into separate function
> > * Configure device with ff_disable set
> >
> > Ayuj Verma (2):
> >   test/crypto: move rsa enqueue/dequeue into separate functions
> >   test/crypto: add tests for RSA key type CRT
> >
> >  app/test/test_cryptodev_asym.c             | 460 +++++++++++++++++------------
> >  app/test/test_cryptodev_rsa_test_vectors.h |  93 ++++++
> >  2 files changed, 363 insertions(+), 190 deletions(-)
> >
> > --
> > 1.8.3.1
>
> Series-acked-by: Arek Kusztal <arkadiuszx.kusztal@intel.com>
>