[dpdk-dev] [PATCH v2] test/graph: fix memory leak

[<kirankumark@marvell.com>]

From: Kiran Kumar K <kirankumark@marvell.com>

Fix memory leaks reported by coverity.

Coverity issue: 358439, 358451, 358448.
Fixes: 6b89650418("test/graph: add functional tests")

Signed-off-by: Kiran Kumar K <kirankumark@marvell.com>
---
V2 changes:
* Added Coverity issue and Fixes info.

 app/test/test_graph.c | 7 +++++--
 1 file changed, 5 insertions(+), 2 deletions(-)

diff --git a/app/test/test_graph.c b/app/test/test_graph.c
index cf6df0744..ed69eda99 100644
--- a/app/test/test_graph.c
+++ b/app/test/test_graph.c
@@ -12,6 +12,7 @@
 #include <rte_graph.h>
 #include <rte_graph_worker.h>
 #include <rte_mbuf.h>
+#include <rte_random.h>

 #include "test.h"

@@ -145,7 +146,7 @@ uint16_t
 test_node_worker_source(struct rte_graph *graph, struct rte_node *node,
 			void **objs, uint16_t nb_objs)
 {
-	uint32_t obj_node0 = rand() % 100, obj_node1;
+	uint32_t obj_node0 = rte_rand() % 100, obj_node1;
 	test_main_t *tm = &test_main;
 	struct rte_mbuf *data;
 	void **next_stream;
@@ -193,7 +194,7 @@ test_node0_worker(struct rte_graph *graph, struct rte_node *node, void **objs,
 	test_main_t *tm = &test_main;

 	if (*(uint32_t *)node->ctx == test_node0.id) {
-		uint32_t obj_node0 = rand() % 100, obj_node1;
+		uint32_t obj_node0 = rte_rand() % 100, obj_node1;
 		struct rte_mbuf *data;
 		uint8_t second_pass = 0;
 		uint32_t count = 0;
@@ -496,6 +497,7 @@ test_lookup_functions(void)
 			printf("Test number of edges for node = %s failed Expected = %d, got %d\n",
 			       tm->test_node[i].node.name,
 			       tm->test_node[i].node.nb_edges, count);
+			free(next_edges);
 			return -1;
 		}

@@ -505,6 +507,7 @@ test_lookup_functions(void)
 				printf("Edge name miss match, expected = %s got = %s\n",
 				       tm->test_node[i].node.next_nodes[j],
 				       next_edges[j]);
+				free(next_edges);
 				return -1;
 			}
 		}
--
2.17.1