Greeting, FYI, we noticed blktests.scsi/004.fail due to commit (built with gcc-11): commit: 76fe86662c283bf322ac1e032c46ddaa0da5cb16 ("[PATCH RESEND v2 09/11] scsi: scsi_debug: Drop sdebug_dev_info.num_in_q") url: https://github.com/intel-lab-lkp/linux/commits/John-Garry/scsi-scsi_debug-Don-t-hold-driver-host-struct-pointer-in-host-hostdata/20230313-173528 base: https://git.kernel.org/cgit/linux/kernel/git/mkp/scsi.git for-next patch link: https://lore.kernel.org/all/20230313093114.1498305-10-john.g.garry@oracle.com/ patch subject: [PATCH RESEND v2 09/11] scsi: scsi_debug: Drop sdebug_dev_info.num_in_q in testcase: blktests version: blktests-x86_64-e3f2ca5-1_20230228 with following parameters: disk: 1HDD test: scsi-group-02 on test machine: 16 threads 1 sockets Intel(R) Xeon(R) CPU D-1541 @ 2.10GHz (Broadwell-DE) with 48G memory caused below changes (please refer to attached dmesg/kmsg for entire log/backtrace): If you fix the issue, kindly add following tag | Reported-by: kernel test robot | Link: https://lore.kernel.org/oe-lkp/202303201334.18b30edc-oliver.sang@intel.com 2023-03-18 00:18:58 sed "s:^:scsi/:" /lkp/benchmarks/blktests/tests/scsi-group-02 2023-03-18 00:18:58 ./check scsi/004 scsi/005 scsi/004 (ensure repeated TASK SET FULL results in EIO on timing out command) scsi/004 (ensure repeated TASK SET FULL results in EIO on timing out command) [failed] runtime ... 1.467s --- tests/scsi/004.out 2023-02-28 16:52:49.000000000 +0000 +++ /lkp/benchmarks/blktests/results/nodev/scsi/004.out.bad 2023-03-18 00:19:00.232079954 +0000 @@ -1,3 +1,2 @@ Running scsi/004 -Input/output error Test complete To reproduce: git clone https://github.com/intel/lkp-tests.git cd lkp-tests sudo bin/lkp install job.yaml # job file is attached in this email bin/lkp split-job --compatible job.yaml # generate the yaml file for lkp run sudo bin/lkp run generated-yaml-file # if come across any failure that blocks the test, # please remove ~/.lkp and /lkp dir to run from a clean state. -- 0-DAY CI Kernel Test Service https://github.com/intel/lkp-tests