From mboxrd@z Thu Jan  1 00:00:00 1970
From: "Pattan, Reshma" <reshma.pattan@intel.com>
Subject: Re: [PATCH v2] test: reduce test duration for efd
	autotest
Date: Wed, 31 Oct 2018 16:11:49 +0000
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Cc: "Marohn, Byron" <byron.marohn@intel.com>, "De Lara Guarch, Pablo"
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Hi,

-----Original Message-----
From: Parthasarathy, JananeeX M=20
Sent: Wednesday, October 31, 2018 2:30 PM
To: dev@dpdk.org
Cc: Marohn, Byron <byron.marohn@intel.com>; De Lara Guarch, Pablo <pablo.de=
.lara.guarch@intel.com>; Pattan, Reshma <reshma.pattan@intel.com>; Parthasa=
rathy, JananeeX M <jananeex.m.parthasarathy@intel.com>
Subject: [PATCH v2] test: reduce test duration for efd autotest

Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.

Commit message should be changed a bit to reflect v2 changes.

 	for (j =3D 0; j < ITERATIONS; j++) {
 		handle =3D rte_efd_create("test_efd", num_rules_in,
-				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+				sizeof(uint8_t), efd_get_all_sockets_bitmask(),

sizeof(uint8_t) =3D=3D> sizeof(simple_key). Now simple key is of type uint6=
4_t.=20

Other than that. Please keep my ack in next version.

Acked-by: Reshma Pattan <reshma.pattan@intel.com>