From mboxrd@z Thu Jan 1 00:00:00 1970 Return-Path: X-Spam-Checker-Version: SpamAssassin 3.4.0 (2014-02-07) on aws-us-west-2-korg-lkml-1.web.codeaurora.org X-Spam-Level: X-Spam-Status: No, score=-6.8 required=3.0 tests=BAYES_00, HEADER_FROM_DIFFERENT_DOMAINS,MAILING_LIST_MULTI,SPF_HELO_NONE,SPF_PASS, USER_AGENT_GIT autolearn=no autolearn_force=no version=3.4.0 Received: from mail.kernel.org (mail.kernel.org [198.145.29.99]) by smtp.lore.kernel.org (Postfix) with ESMTP id 1EBC2C433C1 for ; Thu, 25 Mar 2021 08:32:22 +0000 (UTC) Received: from vger.kernel.org (vger.kernel.org [23.128.96.18]) by mail.kernel.org (Postfix) with ESMTP id D6C2261A1D for ; Thu, 25 Mar 2021 08:32:21 +0000 (UTC) Received: (majordomo@vger.kernel.org) by vger.kernel.org via listexpand id S229728AbhCYIbs (ORCPT ); Thu, 25 Mar 2021 04:31:48 -0400 Received: from szxga06-in.huawei.com ([45.249.212.32]:14893 "EHLO szxga06-in.huawei.com" rhost-flags-OK-OK-OK-OK) by vger.kernel.org with ESMTP id S229662AbhCYIbg (ORCPT ); Thu, 25 Mar 2021 04:31:36 -0400 Received: from DGGEMS414-HUB.china.huawei.com (unknown [172.30.72.59]) by szxga06-in.huawei.com (SkyGuard) with ESMTP id 4F5dZY0hzvzlVpQ; Thu, 25 Mar 2021 16:29:57 +0800 (CST) Received: from DESKTOP-FKFNUOQ.china.huawei.com (10.67.101.50) by DGGEMS414-HUB.china.huawei.com (10.3.19.214) with Microsoft SMTP Server id 14.3.498.0; Thu, 25 Mar 2021 16:31:28 +0800 From: Zhe Li To: CC: , , , , , , , , Subject: Re: [PATCH] jffs2: fix kasan slab-out-of-bounds problem Date: Thu, 25 Mar 2021 16:31:27 +0800 Message-ID: <20210325083127.32796-1-lizhe67@huawei.com> X-Mailer: git-send-email 2.21.0.windows.1 In-Reply-To: References: MIME-Version: 1.0 Content-Transfer-Encoding: 7BIT Content-Type: text/plain; charset=US-ASCII X-Originating-IP: [10.67.101.50] X-CFilter-Loop: Reflected Precedence: bulk List-ID: X-Mailing-List: linux-kernel@vger.kernel.org >Reviewe-by: Joakim Tjernlund Thanks for your review. >It would be interesting to known how you managed to create such a dir entry as that is a bug too. We discovered this bug by performing fuzzing tests, which simulate bit flips that may occur anywhere in a flash device in real-world scenarios.