Re: [PATCH v2 11/17] iio: core: Introduce _inputoffset for differential channels

From: Jonathan Cameron <jic23@kernel.org>
To: Andy Shevchenko <andy.shevchenko@gmail.com>
Cc: linux-iio <linux-iio@vger.kernel.org>,
	Peter Rosin <peda@axentia.se>,
	Michael Hennerich <michael.hennerich@analog.com>,
	Lars-Peter Clausen <lars@metafoo.de>,
	Vincent Whitchurch <vincent.whitchurch@axis.com>,
	Jonathan Cameron <Jonathan.Cameron@huawei.com>
Subject: Re: [PATCH v2 11/17] iio: core: Introduce _inputoffset for differential channels
Date: Mon, 20 Jun 2022 19:13:07 +0100	[thread overview]
Message-ID: <20220620191307.7f8fefa7@jic23-huawei> (raw)
In-Reply-To: <CAHp75Vdf3aWaeT17cxsm=a7LUSpc1LnoMGkRQS8O_3ftufprLg@mail.gmail.com>

On Mon, 20 Jun 2022 01:20:08 +0200
Andy Shevchenko <andy.shevchenko@gmail.com> wrote:

> On Sun, Jun 19, 2022 at 8:59 PM Jonathan Cameron <jic23@kernel.org> wrote:
> >
> > From: Jonathan Cameron <Jonathan.Cameron@huawei.com>
> >
> > Address an ABI gap for device where the offset of both lines in a
> > differential pair may be controlled so as to allow a wider range of
> > inputs, but without having any direct effect of the differential
> > measurement.
> >
> > _offset cannot be used as to remain in line with existing usage,
> > userspace would be expected to apply it as (_raw + _offset) * scale
> > whereas _inputoffset is not.
> > Similarly calibbias is expected to tweak the measurement seen, not
> > the adjust the two lines of the differential pair.
> >
> > Needed for in_capacitanceX-capacitanceY_inputoffset for the
> > AD7746 CDC driver.
> >
> > Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
> >
> > ---
> > I''m not entirely happy with the naming on this one, so if anyone
> > has a better idea I'm definitely open to it!  
> 
> I'm not sure I got the idea behind this, but would be "tare" /
> "tarepoint" / alike suitable here?
>

Hmm I don't think tare maps well as I've never seen it applied to a
differential channel like this.  Not really seen it much used outside
of checkweighing (the mention brought back some horrible memories
of debugging software for high speed check weighers :)

So to try and explain what this is doing in more depth.

This is basically applying a negative offset X to both the P(ostitive) and
N(egative) lines. Hence

measured capacitance = (P - X) - (N - X)
                     = P - N

the aim of X being to keep the signal hitting some internal point on
the device within a range that is measurable.

The relevant text on the datasheet is:

"The CAPDAC can be understood as a negative capacitance
connected internally to the CIN pin."

"Each of the two input capacitances CX and CY between the EXC
and CIN pins must be less than 4 pF (without using the
CAPDACs) or must be less than 21 pF and balanced by the
CAPDACs. Balancing by the CAPDACs means that both
CX–CAPDAC(+) and CY–CAPDAC(–) are less than 4 pF."

So basically if you have both sides of the differential pair
that are too large (>4 pF) then you can drag them together
down to that range by adding negative capacitance.

Ouch that's confusing :)

Jonathan