Re: [PATCH v6 2/2] test/test: add unit test for CRC computation

["De Lara Guarch, Pablo" <pablo.de.lara.guarch@intel.com>]

Hi Jasvinder,

> -----Original Message-----
> From: Singh, Jasvinder
> Sent: Wednesday, March 29, 2017 1:42 PM
> To: dev@dpdk.org
> Cc: olivier.matz@6wind.com; Doherty, Declan; De Lara Guarch, Pablo
> Subject: [PATCH v6 2/2] test/test: add unit test for CRC computation
> 
> This patch provides a set of tests for verifying the functional
> correctness of 16-bit and 32-bit CRC APIs.
> 
> Signed-off-by: Jasvinder Singh <jasvinder.singh@intel.com>
> ---
>  test/test/Makefile   |   2 +
>  test/test/test_crc.c | 241
> +++++++++++++++++++++++++++++++++++++++++++++++++++
>  2 files changed, 243 insertions(+)
>  create mode 100644 test/test/test_crc.c
> 

...

> diff --git a/test/test/test_crc.c b/test/test/test_crc.c
> new file mode 100644
> index 0000000..c25790d
> --- /dev/null
> +++ b/test/test/test_crc.c
> @@ -0,0 +1,241 @@

...

> +static int
> +test_crc_scalar(void)

Could you merge this and the next function in a single one,
as they are duplicated (except for the comments/printfs, which can be a parameter of the function).

Apart from this:

Acked-by: Pablo de Lara <pablo.de.lara.guarch@intel.com>