Re: [PATCH] staging: iio: trigger: Use standard attr for sampling frequency

[Octavian Purdila <octavian.purdila@intel.com>]

On Wed, Mar 11, 2015 at 6:36 PM, Daniel Baluta <daniel.baluta@intel.com> wrote:
>
> As written in Documentation/ABI/testing/sysfs-bus-iio the trigger
> attribute for sampling frequency should be sampling_frequency.
>
> Fix this for iio-trig-periodic-rtc module in order to prepare it
> for moving out of staging.
>
> Signed-off-by: Daniel Baluta <daniel.baluta@intel.com>
> ---
> Jonathan, this module is very useful for devices that do not have
> an interrupt pin.
>
> We are working on drivers for such devices and would be very nice to
> move this driver in advance to the IIO non-staging location.
>
> What do you say?
>

Hmm, I wonder what are the advantages of using RTC timers. Couldn't we
use a regular kernel timer instead?


>  drivers/staging/iio/trigger/iio-trig-periodic-rtc.c | 4 ++--
>  1 file changed, 2 insertions(+), 2 deletions(-)
>
> diff --git a/drivers/staging/iio/trigger/iio-trig-periodic-rtc.c b/drivers/staging/iio/trigger/iio-trig-periodic-rtc.c
> index 89df1d3..f1cfe2d 100644
> --- a/drivers/staging/iio/trigger/iio-trig-periodic-rtc.c
> +++ b/drivers/staging/iio/trigger/iio-trig-periodic-rtc.c
> @@ -87,12 +87,12 @@ error_ret:
>         return ret;
>  }
>
> -static DEVICE_ATTR(frequency, S_IRUGO | S_IWUSR,
> +static DEVICE_ATTR(sampling_frequency, S_IRUGO | S_IWUSR,
>             iio_trig_periodic_read_freq,
>             iio_trig_periodic_write_freq);
>
>  static struct attribute *iio_trig_prtc_attrs[] = {
> -       &dev_attr_frequency.attr,
> +       &dev_attr_sampling_frequency.attr,
>         NULL,
>  };
>
> --
> 1.9.1
>
> --
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